The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2006
Filed:
Apr. 21, 2005
Ekkehard Gerndt, Karlsruhe, DE;
Michael Jacob, Karlsruhe, DE;
Ekkehard Gerndt, Karlsruhe, DE;
Michael Jacob, Karlsruhe, DE;
Bruker AXS GmbH, Karlsrue, DE;
Abstract
A method for operating an X-ray analysis device is characterized by the following steps: a) recording a first data set in a first relative spatial position of a source, an object and a detector; b) displacement and/or rotation of the detector in the detector plane relative to the source and the object, whereby the relative position of source and object is not changed; c) recording a second data set In the position displaced according to step b); and d) superposition of the recorded data sets to form an overall data set, wherein the pixels of the recorded data sets are combined corresponding to their actual relative position with respect to the source and object.