The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2006
Filed:
Aug. 20, 2004
Daniel Paul Beaman, Cedar Park, TX (US);
John Saunders Corbin, Jr., Austin, TX (US);
Dales Morrison Kent, Round Rock, TX (US);
Howard Victor Mahaney, Jr., Cedar Park, TX (US);
Hoa Thanh Phan, Austin, TX (US);
Frederic William Wright, Iv, Newburgh, NY (US);
Daniel Paul Beaman, Cedar Park, TX (US);
John Saunders Corbin, Jr., Austin, TX (US);
Dales Morrison Kent, Round Rock, TX (US);
Howard Victor Mahaney, Jr., Cedar Park, TX (US);
Hoa Thanh Phan, Austin, TX (US);
Frederic William Wright, IV, Newburgh, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An innovative chip testing system and method includes controlling temperature and condensation during testing. Coarse temperature is controlled by providing a desired fluid flow rate and fluid temperature to a cold plate. Fine temperature control is provided by a feedback loop which controls the power dissipation of cartridge heaters installed within the cold plate. Condensation control is provided by insulating various components of the system, manipulation of dry compressed air in enclosures to reduce surface dew point temperatures, usage of cartridge heaters in a card backside stiffener plate, and by providing a heatsink assembly which prevents condensation on the insulation.