The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7133735 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 07, 2006

Filed:

Jan. 27, 2005
Applicants:

Wen-chang Kuo, Hsinchu, TW;

Chien-chung Huang, Taichung, TW;

Huei-wen Yang, Taichung, TW;

Yi-lin Huang, Keelung, TW;

Inventors:

Wen-Chang Kuo, Hsinchu, TW;

Chien-Chung Huang, Taichung, TW;

Huei-Wen Yang, Taichung, TW;

Yi-Lin Huang, Keelung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method thereof for experiment management. A storage device stores an experiment plan record, a merge constraint and an integration rule. A processing unit configured to acquire a first experiment plan from the experiment plan record, and a second experiment plan. The processing unit generates an integrated experiment plan by merging the first experiment plan and the second experiment plan according to the merge constraint and the integration rule, and stores the integrated experiment plan to the storage device.


Find Patent Forward Citations

Kuo, Wen-Chang. (2006). Experiment management system and method thereof in semiconductor manufacturing environment (U.S. Patent No. 7133735). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7133735

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…