The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2006

Filed:

Aug. 21, 2003
Applicants:

Nick Sherstyuk, Ottawa, CA;

Dean Brotzel, Ottawa, CA;

Inventors:

Nick Sherstyuk, Ottawa, CA;

Dean Brotzel, Ottawa, CA;

Assignee:

Synopsys Inc., Mountain View, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a method of interactive visualization and parameter selection for engineering design. Initially, a nominal topology and associated design variables are set. The design variables are treated as being independent of each other for the purposes of a design variable sweep or sensitivity analysis to determine effects of changes in design variables on performance. The results of the sweep are presented to a designer, for example, by a suitable software tool including a graphical user interface. The designer selects design variables and revises their values based on the visually presented results of the sweep and effects a simulation using the revised values. If the results are satisfactory and a stopping condition is satisfied then the method is done. Otherwise, a determination must be made as to whether additional values can be changed or whether a new sweep must be effected. If a sweep is to be made, according the method of the present invention, an optional step is to change to topology prior to sweeping.


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