The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2006
Filed:
Jan. 12, 2001
Kevin M. Harer, Beaverton, OR (US);
Pei-hsin Ho, Portland, OR (US);
Robert F Damiano, Lake Oswego, OR (US);
Kevin M. Harer, Beaverton, OR (US);
Pei-Hsin Ho, Portland, OR (US);
Robert F Damiano, Lake Oswego, OR (US);
Synopsys, Inc., Mountain View, CA (US);
Abstract
System, methods, and apparatus for verifying microcircuit designs by interleaving between random and formal simulation techniques to identify input traces useful for driving designs under test into sequences of device states. In a method aspect the invention provides process for beginning random simulation of a sequence of states of a microcircuit design by inputting a sequence of random input vectors to a design under test model in order to obtain a sequence of random simulation states; monitoring a simulation coverage progress metric to determine a preference for switching from random simulation to formal methods of simulating states in the design under test; beginning formal simulation of states in the design under test and monitoring a formal coverage progress metric to determine a preference for resuming random simulation of states of said microcircuit design; and resuming random simulation. Preferably the process of interleaving simulation methods continues until an input vector suitable for driving the design under test model into each of a set of previously-identified goal states has been obtained.