The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2006
Filed:
Oct. 31, 2003
Haruo Yoshida, Tsukuba, JP;
Hirokazu Matsumoto, Tsukuba, JP;
Yoshio Hino, Tsukuba, JP;
Masaru Arai, Tsukuba, JP;
Masataka Nakazawa, Miyagi, JP;
Haruo Yoshida, Tsukuba, JP;
Hirokazu Matsumoto, Tsukuba, JP;
Yoshio Hino, Tsukuba, JP;
Masaru Arai, Tsukuba, JP;
Masataka Nakazawa, Miyagi, JP;
Abstract
In a measuring-instrument remote-calibration system and measuring-instrument remote-calibration method, a measuring standard quantity is converted into a parameter adapted for communication, or based on measuring standard quantity, a parameter adapted for communication is generated and sent to a remote place. Alternatively, when the measuring standard quantity is not suitable for communication, it is converted into a form adapted for transportation and the converted measuring standard quantity is sent to a remote place. After the converted measuring standard quantity reaches the place, it is restored to the original measuring standard quantity, thus enabling calibration. The result of the calibration is certified.