The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2006

Filed:

May. 27, 2005
Applicant:

Kei-wean C. Yang, Beaverton, OR (US);

Inventor:

Kei-Wean C. Yang, Beaverton, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A differential measurement probe has spring loaded probe assemblies and a pressure sensors disposed in a housing. The pressure sensors forms an electrical switch having an electrical AND function for passing an activation signal to a EOS/ESD protection control module in response to axial movement of the housing relative to the probe assemblies. First compressive elements produces first pre-loaded compressive forces and increasing compressive forces on the probe assemblies and second compressive elements produces second pre-loaded compressive forces and increasing compressive forces on the probe assemblies subsequent to the first increasing compressive forces on the probe assemblies.


Find Patent Forward Citations

Yang, Kei-Wean. (2006). Differential signal acquisition probe having retractable double cushioned probing tips with eos/esd protection capabilities (U.S. Patent No. 7126360). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7126360

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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