The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2006
Filed:
Dec. 24, 2003
Masaharu Tsujii, Yamato, JP;
Fumihiko Koshimizu, Zama, JP;
Eiji Furuta, Sagamihara, JP;
Ryouji Nakamura, Ayase, JP;
Satoko Nomaguchi, Sagamihara, JP;
Ryotaro Fukuchi, Hikone, JP;
Masaharu Tsujii, Yamato, JP;
Fumihiko Koshimizu, Zama, JP;
Eiji Furuta, Sagamihara, JP;
Ryouji Nakamura, Ayase, JP;
Satoko Nomaguchi, Sagamihara, JP;
Ryotaro Fukuchi, Hikone, JP;
Mitutoyo Corporation, Kawasaki, JP;
Abstract
A hardness testing apparatus has an indenter shaft having an indenter at a top thereof, a force motor for moving the indenter shaft in its axial direction and applying a predetermined test force to a sample through the indenter, an external force detection section for detecting an external force applied from outside of the hardness testing apparatus to the indenter shaft when the indenter shaft is moved by the force motor, and an external force adjustment and control section for controlling the force motor to apply the predetermined test force to the sample while deadening the external force detected by the external force detection section.