The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2006
Filed:
Mar. 26, 2002
Bryan K. Casper, Hillsboro, OR (US);
Stephen R. Mooney, Beaverton, OR (US);
Aaron K. Martin, Hillsboro, OR (US);
Joseph T. Kennedy, Beaverton, OR (US);
Matthew B. Haycock, Beaverton, OR (US);
Bryan K. Casper, Hillsboro, OR (US);
Stephen R. Mooney, Beaverton, OR (US);
Aaron K. Martin, Hillsboro, OR (US);
Joseph T. Kennedy, Beaverton, OR (US);
Matthew B. Haycock, Beaverton, OR (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
A clock deskew method includes receiving a data signal and a clock signal, processing the data signal to generate a jitter characterization parameter, shifting the clock signal by about 90° from the jitter characterization parameter to generate a sampling clock signal, and sampling the data signal with the sampling clock signal to generate a deskewed data signal. A clock deskew unit includes a clock unit, a sampling unit, and a deskew unit. The deskew unit includes a jitter characterization unit that generates a jitter characterization parameter. The jitter characterization parameter establishes a phase location for aligning a clock signal. Shifting the clock signal by about 90° from the phase location of the jitter characterization parameter provides a location for sampling a data signal to generate a deskewed data signal.