The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2006
Filed:
Jun. 15, 2002
Mark Mcdonald, Milpitas, CA (US);
Mark Rice, San Jose, CA (US);
Andrew Daiber, Palo Alto, PA (US);
William B. Chapman, Sunnyvale, CA (US);
Mark McDonald, Milpitas, CA (US);
Mark Rice, San Jose, CA (US);
Andrew Daiber, Palo Alto, PA (US);
William B. Chapman, Sunnyvale, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
Apparatus and methods usable for wavelength references and measurement of wavelength of a light beam. The apparatus comprise at least two wavelength reference or filter elements positioned in a light beam, each wavelength reference element having a different free spectral range and operable to define a joint free spectral range, and a detector positioned in the beam after the wavelength reference elements. The joint free spectral range provided by the multiple wavelength reference elements results in a joint transmission peak that is centered at a unique wavelength, and maximum optical power detectable from the beam by the detector occurs at the center wavelength of the joint transmission peak.