The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2006
Filed:
Dec. 20, 2002
Applicant:
Grady Borders, West Hills, CA (US);
Inventor:
Grady Borders, West Hills, CA (US);
Assignee:
Teradyne, Inc., Boston, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/04 (2006.01); G11C 15/04 (2006.01); G01R 31/18 (2006.01);
U.S. Cl.
CPC ...
Abstract
A failure analysis memory is disclosed for use with a semiconductor tester for storing bit image failure information relating to a memory-under-test. The semiconductor tester has a plurality of channel cards disposed proximate the memory-under-test. The failure analysis memory includes a memory controller and a plurality of memory units disposed in communication with the memory controller. The memory units are distributed on the channel cards.