The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2006

Filed:

Aug. 20, 2004
Applicants:

Devendra K. Sadana, Pleasantville, NY (US);

Dominic J. Schepis, Wappingers Falls, NY (US);

Michael D. Steigerwalt, Newburgh, NY (US);

Inventors:

Devendra K. Sadana, Pleasantville, NY (US);

Dominic J. Schepis, Wappingers Falls, NY (US);

Michael D. Steigerwalt, Newburgh, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/762 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a method of fabricating a patterned silicon-on-insulator substrate which includes dual depth SOI regions or both SOI and non-SOI regions within the same substrate. The method of the present invention includes forming a silicon mask having at least one opening on a surface of Si-containing material, recessing the Si-containing material through the at least one opening using an etching process to provide a structure having at least one recess region and a non-recessed region, and forming a first buried insulating region in the non-recessed region and a second buried insulating region in the recessed region. In accordance with the present invention, the first buried insulating region in the non-recessed region is located above the second buried isolation region in the recessed region. A lift-off step can be employed to remove the first buried insulating region and the material that lies above to provide a substrate containing both SOI and non-SOI regions.


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