The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2006
Filed:
Sep. 24, 2002
Applicants:
Olaf Sünwoldt, Berlin, DE;
Heiko Haschke, Rostock, DE;
Inventors:
Olaf Sünwoldt, Berlin, DE;
Heiko Haschke, Rostock, DE;
Assignee:
JPK Instruments AG, Berlin, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention relates to a probe () mounting device for a scanning probe microscope, especially a scanning force microscope, comprising a retaining member () for installation in a measuring assembly of a scanning probe microscope. The probe () is detachably mounted on the retaining member () by means of a clamping member (), the clamping member being secured in self-locking fashion to the retaining member ().