The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2006
Filed:
Dec. 10, 2002
Jayabrata Ghosh Dastidar, Santa Clara, CA (US);
Michael Harms, Pleasanton, CA (US);
Jayabrata Ghosh Dastidar, Santa Clara, CA (US);
Michael Harms, Pleasanton, CA (US);
Altera Corporation, San Jose, CA (US);
Abstract
Techniques for isolating and repairing failures on a programmable circuit are provided. An error on programmable circuit may be caused by a defect on the chip. The error is located, and the circuit elements effected by the defect are isolated. By identifying operable circuit elements near the defect, the number of circuit elements that are adversely effected by the defected can be narrowed down. The failed circuit elements adversely effected by the defect are then shut down and cut off from the rest of the programmable circuit. The functionality performed by the failed circuit elements is transferred to an unused portion of the programmable circuit. The se techniques reduce the amount of circuit elements that need to be shut down as a result of a defect on a programmable circuit.