The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2006
Filed:
Jun. 12, 2003
Win-harn Liu, Taipei, TW;
Jeff Song, Taipei, TW;
Yong-juen Shi, Tianjin, CN;
Inventec Corporation, Taipei, TW;
Abstract
A multithread auto test method is disclosed for the test process of computer hardware. According to the exclusion relation among the unique IDs of the test items, a multithread executable logic is automatically generated. An appropriate parallel method is employed to find procedures for test items that do not have conflictions. Therefore, multithreads of test procedures are performed to increase the test efficiency and quality. The method includes the steps of: determining a unique ID of a test item; automatically generating a test logic table according to the exclusion relation among the unique IDs; and performing multithread test procedure according to the test logic given in the test logic table.