The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2006
Filed:
Apr. 24, 2002
Applicants:
Piet Dewaele, Berchem, BE;
Gert Behiels, Leuven, BE;
Inventors:
Piet Dewaele, Berchem, BE;
Gert Behiels, Leuven, BE;
Assignee:
Agfa-Gevaert N.V., Mortsel, BE;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Several methods for retrospective correction of intensity inhomogeneites in digital diagnostic radiation images are presented. The methods are based on the correction of a digital image representation by means of a bias field. The bias field is deduced from the digital image representation of the diagnostic radiation image.
Dewaele, Piet. (2006). Retrospective correction of inhomogeneities in radiographs (U.S. Patent No. 7110588). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7110588
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