The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2006

Filed:

Oct. 21, 2003
Applicants:

Brian Amick, Brookline, MA (US);

Dong Joon Yoon, San Jose, CA (US);

Tri Tran, San Leandro, CA (US);

Gajendra Singh, Sunnyvale, CA (US);

Aparna Ramachandran, Sunnyvale, CA (US);

Claude Gauthier, Cupertino, CA (US);

Inventors:

Brian Amick, Brookline, MA (US);

Dong Joon Yoon, San Jose, CA (US);

Tri Tran, San Leandro, CA (US);

Gajendra Singh, Sunnyvale, CA (US);

Aparna Ramachandran, Sunnyvale, CA (US);

Claude Gauthier, Cupertino, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A digital delay locked loop uses a delay array to delay an input signal by an amount indicated by a delay code. A phase of the resulting delayed signal is compared to a corresponding phase of the input signal, and dependent on the comparison, the delay code is updated to indicate whether the delay array needs to provide more delay or less delay. The digital delay locked loop also uses a detection circuit that monitors for a predetermined condition of the delay code. In response to detection of the predetermined condition, the delay code is automatically reset to a value different than a value of the delay code present at a previous reset or initial startup of the digital delay locked loop.


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