The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2006
Filed:
Jun. 01, 2004
Takeshi Yaguchi, Tokyo, JP;
Takeshi Yaguchi, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
A test apparatus for testing an electric device includes a plurality of signal input-output units for inputting and/or outputting test signals in response to each of a plurality of terminals included by the electric device, a channel selection memory for storing pieces of channel selection information indicating whether each of the signal input-output units should perform setting based on a setting condition or not, a setting condition memory for storing the setting condition with regard to the signal input-output unit, and a controlling means for retrieving and supplying the setting condition stored in the setting condition memory and the channel selection information stored in the channel selection memory to the signal input-output units based on a setting instruction, when receiving the setting instruction to set the setting condition of the signal input-output unit, wherein when at least one of the signal input-output units is selected by the channel selection information supplied from the controlling means, the one of the signal input-output units is set based on the setting condition supplied from the controlling means.