The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2006
Filed:
Dec. 19, 2002
Hideo Kikuchi, Tokyo, JP;
Mikio Oda, Tokyo, JP;
Hikaru Kouta, Tokyo, JP;
Sakae Kitajo, Tokyo, JP;
Yuzo Shimada, Tokyo, JP;
Yoshio Matsumoto, Tokyo, JP;
Shinichi Tamabayashi, Tokyo, JP;
Hideo Kikuchi, Tokyo, JP;
Mikio Oda, Tokyo, JP;
Hikaru Kouta, Tokyo, JP;
Sakae Kitajo, Tokyo, JP;
Yuzo Shimada, Tokyo, JP;
Yoshio Matsumoto, Tokyo, JP;
Shinichi Tamabayashi, Tokyo, JP;
NEC Toppan Circuit Solutions, Inc., Tokyo, JP;
Abstract
There is disclosed a method of inspecting an optical waveguide substrate for optical conduction at an increased inspecting rate and also inspecting an optical waveguide substrate for cross-talk. According to the disclosed method, a laser beam is applied from a laser beam scanning optical system to one end face of an optical waveguide of an optical waveguide substrate which is an object to be inspected, and the laser beam emitted from the other end of the optical waveguide is detected by a CCD camera, which output detected result data. A light spot position confirming device compares the detected result data with stored data.