The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7105856 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 12, 2006

Filed:

Mar. 31, 2005
Applicants:

Hsin-chang Wu, Hsin-Chu, TW;

Tzu-chien Chuang, Hsin-Chu, TW;

Inventors:

Hsin-Chang Wu, Hsin-Chu, TW;

Tzu-Chien Chuang, Hsin-Chu, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test key formed on a semiconductor substrate has a plurality of electronic components, a plurality of conductors, a plurality of vias for connecting the electronic components and the conductors, a first pad, a second pad, a third pad, and a fourth pad. The first pad, the electronic components, the vias, the conductors, and the second pad connects in series to form a chain circuit, and the first pad and the second pad are positioned at two ends of the chain circuit. A Kelvin structure is composed of the third pad, the fourth pad, one of the conductors, one of the vias, and one of the electronic components.


Find Patent Forward Citations

Wu, Hsin-Chang. (2006). Test key having a chain circuit and a kelvin structure (U.S. Patent No. 7105856). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7105856

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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