The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2006
Filed:
May. 27, 2005
Applicant:
Asher Pearl, Kadimah, IL;
Inventor:
Asher Pearl, Kadimah, IL;
Assignee:
Applied Materials, Israel, Ltd., Rehovot, IL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/00 (2006.01); H01J 37/244 (2006.01); H01J 37/302 (2006.01); G21G 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for calibrating operational parameters of a charged particle beam device comprises generating a plurality of distinct spots on a specimen, each spot being generated in response to adjusted operational parameters of the charged particle beam device, and registering said respective operational parameters.
Pearl, Asher. (2006). Method and system for controlling focused ion beam alignment with a sample (U.S. Patent No. 7105843). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7105843
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile