The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2006
Filed:
Sep. 22, 2003
Hiroyuki Matsuura, Tokyo, JP;
Hiroshi Ichikawa, Tokyo, JP;
Toshio Kimura, Tokyo, JP;
Takeshi Aikiyo, Tokyo, JP;
Masayoshi Seki, Tokyo, JP;
Hiroyuki Matsuura, Tokyo, JP;
Hiroshi Ichikawa, Tokyo, JP;
Toshio Kimura, Tokyo, JP;
Takeshi Aikiyo, Tokyo, JP;
Masayoshi Seki, Tokyo, JP;
The Furukawa Electric Co., Ltd., Tokyo, JP;
Abstract
A method and apparatus for inspecting a plurality of optical modules, in which the optical modules are given channel numbers, a plurality of inspection items, which are related to optical characteristics and/or electrical characteristics of the optical modules, are measured in parallel, and measurement data on the inspection items is stored in storing device. This makes it possible to inspect the optical modules efficiently in a short time, eliminating waiting time.