The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2006
Filed:
Jul. 08, 2003
Kaoru Matsuki, Tsukuba, JP;
Kazuhiko Hidaka, Tsukuba, JP;
Kaoru Matsuki, Tsukuba, JP;
Kazuhiko Hidaka, Tsukuba, JP;
Mitutoyo Corporation, Kawasaki, JP;
Abstract
A surface profile measuring instrument for measuring a surface profile of a workpiece has: a probe having a stylus provided with a measuring portion for measuring a surface of a workpiece at a tip end thereof and a detector for outputting a detection signal which varies depending on a measurement condition between the surface of the workpiece and the measuring portion; a scanning mechanism for relatively moving the measuring portion along the surface of the workpiece; a memory () that stores a position information of the contact portion when the detection signal reaches a predetermined reference signal value; a vibration inclination angle calculator () that calculates a response variation factor (vibration inclination angle θ) that applies variation to the detection signal from the surface of the workpiece; and a profile processor () that corrects the position information to obtain an actual profile of the surface of the workpiece using the response variation factor.