The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2006
Filed:
Jun. 18, 2004
Neal Meyer, Chandler, AZ (US);
Brett Neal, Gilbert, AZ (US);
Andrew Mcronald, Beaverton, OR (US);
Lee Genz, Chandler, AZ (US);
Ping Sun, Gilbert, AZ (US);
Gene Garrison, Aloha, OR (US);
Neal Meyer, Chandler, AZ (US);
Brett Neal, Gilbert, AZ (US);
Andrew McRonald, Beaverton, OR (US);
Lee Genz, Chandler, AZ (US);
Ping Sun, Gilbert, AZ (US);
Gene Garrison, Aloha, OR (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
A system to evaluate a distance between polyline segments includes identification of a first polyline and a second polyline associated with a differential signal, determination of whether a distance between a segment of the first polyline and a segment of the second polyline is within a first tolerance, and, if the distance is not within the first tolerance, determining whether the distance is within a second tolerance. If the distance is not within the first tolerance and is within the second tolerance, it is determined whether the length of the segment of the first polyline is less than a first threshold. If the distance is not within the first tolerance and is within the second tolerance, and if the length of the segment of the first polyline is less than the first threshold, it is indicated that the first polyline and the second polyline are sufficiently spaced. If the distance is not within the second tolerance or if the length of the segment of the first polyline is greater than the first threshold, it is determined whether the segments are located near a device pin, and, if the segments are not located near a device pin, it is indicated that the first polyline and the second polyline are not sufficiently spaced.