Limiting performance in an integrated circuit to meet export restrictions

Abstract

An integrated circuit includes at least a first fuse and at least a first processor. Each fuse is in either a conductive state or a non-conductive state. The first processor is configured to operate at one of at least a first issue rate or a second issue rate responsive to the state of the first fuse. The first issue rate is lower than the second issue rate. In another embodiment, the first processor is configured to execute fewer instructions in a period of time responsive to a first state of the conductive state or the non-conductive state of the first fuse than the first processor is configured to execute in the period of time responsive to a second state of the first fuse. A method includes: (i) determining if an integrated circuit comprising at least one processor has a performance rating that exceeds a government-imposed export restriction; and (ii) in response to the performance rating exceeding the export restriction, blowing at least one fuse on the integrated circuit. The processor responds to a blown state of the fuse by executing, during use, fewer instructions per period of time than the processor would otherwise execute.