The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2006
Filed:
Aug. 09, 2004
Applicant:
Bruce L. Bateman, Fremont, CA (US);
Inventor:
Bruce L. Bateman, Fremont, CA (US);
Assignee:
T-RAM, Inc., Milpitas, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 19/00 (2006.01); G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A sampling circuit for testing an integrated circuit receives several signals from points of interest in the integrated circuit, digitizes them, and determines whether the digitized signal is above or below a threshold. By sampling the signal at different phases of a system clock signal, a determination can be made of when during the system clock signal the signal at a point of interest changed state. Circuits are provided for making minimal impact on the circuit being observed. Circuits are also provided for clocking the observed signal so that it can be compared to other observed signals.