The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2006

Filed:

Feb. 17, 2004
Applicants:

Masashi Miyazaki, Tokyo, JP;

Kenji Inaba, Tokyo, JP;

Toshiyuki Miura, Tokyo, JP;

Inventors:

Masashi Miyazaki, Tokyo, JP;

Kenji Inaba, Tokyo, JP;

Toshiyuki Miura, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A testing apparatus having testing module slots onto which different types of testing modules are selectively mounted includes controlling modules for supplying control signals to the testing modules mounted on the testing module slots. The control signals are used for controlling the testing module. The apparatus also includes a setting information supplying unit for supplying hardware setting information to a specific testing module, an enable signal controlling unit for instructing the specific testing module to generate and supply an enable signal to the controlling module corresponding to the specific testing module, and a setting unit for setting the controlling module received said enable signal from the specific testing module so as to supply the control signal corresponding to the specific testing module based on the hardware setting information.


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