The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2006
Filed:
Feb. 04, 2003
Skiff Sokolov, Lidingö, SE;
Skiff Sokolov, Lidingö, SE;
Xcounter AB, Danderyd, SE;
Abstract
A method for examining an object includes the steps of: producing ionizing radiation photons; providing other particles or photons, each of which carrying information regarding position, time, movement direction, and/or energy of a respective one of said ionizing radiation photons before having interacted with said object to be examined; detecting each of said other particles or photons to retrieve said information; having said ionizing radiation photons to interact with said object to be examined; detecting at least some of said ionizing radiation photons after having interacted with said object to retrieve information regarding position, time, movement direction, and/or energy of each of said detected ionizing radiation photons; correlating each of said detected ionizing radiation photons with a respective one of said other particles or photons; and deducing information of said examined object by means of said information as retrieved in the steps of detection.