The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7095023 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 22, 2006

Filed:

Oct. 22, 2004
Applicants:

Osamu Nagano, Kanagawa, JP;

Atsushi Ando, Tokyo, JP;

Inventors:

Osamu Nagano, Kanagawa, JP;

Atsushi Ando, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A charged particle beam apparatus includes: a charged particle beam source which generates a charged particle beam to irradiate the charged particle beam onto a specimen; a demagnification optical system which demagnifies the charged particle beam; a deflector which deflects the charged particle beam to scan the specimen; and a first charged particle detector having a detection surface to detect a charged particle generated from the specimen which has been irradiated with the charged particle beam; wherein the detection surface of the first charged particle detector is disposed so as to face towards the charged particle beam source.


Find Patent Forward Citations

Nagano, Osamu. (2006). Charged particle beam apparatus, charged particle detection method, and method of manufacturing semiconductor device (U.S. Patent No. 7095023). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7095023

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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