The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2006
Filed:
Apr. 30, 2002
Eric M. Leproust, Campbell, CA (US);
David L. Hirschberg, Menlo Park, CA (US);
Glenda C. Delenstarr, Belmont, CA (US);
Eric M. Leproust, Campbell, CA (US);
David L. Hirschberg, Menlo Park, CA (US);
Glenda C. Delenstarr, Belmont, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
The invention provides an apparatus and method for determining a signal produced by a micro array device. The apparatus provides an unstructured probe and structured probe. The unstructured probe binds to a target and provides a first signal that can be compared to a second signal produced by a structured probe. A more accurate level of intensity of the first signal can be determined by comparing to the second signal produced by the structured probe. A method for determining a more accurate level of signal intensity produced from the unstructured probes bound to the target is also disclosed.