The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2006

Filed:

Mar. 23, 2005
Applicants:

Kenneth Syracuse, Clarence Center, NY (US);

Noelle Waite, Clarence Center, NY (US);

Hong Gan, Williamsville, NY (US);

Esther S. Takeuchi, East Amherst, NY (US);

Inventors:

Kenneth Syracuse, Clarence Center, NY (US);

Noelle Waite, Clarence Center, NY (US);

Hong Gan, Williamsville, NY (US);

Esther S. Takeuchi, East Amherst, NY (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is directed to a method for analyzing the tail-end behavior of a lithium cell having a solid cathode. The tail of a longer-term accelerated discharge data (ADD) test is estimated from the tail of two shorter-term ADD tests. This is accomplished by first comparing the discharge tails of shorter-term ADD tests and determining angles or rotation that correspond to Rdc growth, and then trending rotation angles versus time to reach a give DoD. For example, the 18-month and 36-month ADD test tails are used to estimate the ADD test tail of a similarly constructed cell subjected to a longer-term ADD test, for example a 48-month ADD test.


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