The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2006
Filed:
Apr. 07, 2004
Assunta Vigliante, Stuttgart, DE;
Assunta Vigliante, Stuttgart, DE;
Bruker AXS GmbH, Karlsruhe, DE;
Abstract
An X-ray diffractometer () comprising an X-ray source () emitting a line focus X-ray beam () wherein the larger extension of the beam cross section defines a line direction () of the X-ray beam (), further comprising a sample (), and an X-ray detector () rotatable in a scattering plane around an axis ω intersecting the position of the sample () is characterized in that the X-ray source is mounted to a switching device (), which allows to move the X-ray source into one of two fixed positions with respect to the scattering plane, wherein in the first position the line direction () of the X-ray beam () is parallel to the scattering plane and in the second position the line direction () of the X-ray beam () is perpendicular to the scattering plane, and wherein the path of the X-ray beam () in the two fixed positions of the X-ray source is the same. This X-ray diffractometer has a simple mechanical setup and allows in plane grazing incidence diffraction as well as regular XRD measurements with good resolution.