The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2006
Filed:
Apr. 04, 2005
Jerry D. Ackaret, Beaverton, OR (US);
Richard B. Bhend, Rochester, MN (US);
David F. Heidel, Mahopac, NY (US);
Naoko Pia Sanda, Chappaqua, NY (US);
Scott B. Swaney, Catskill, NY (US);
Jane Jones, Legal Representative, Yorktown Heights, NY (US);
Jerry D. Ackaret, Beaverton, OR (US);
Richard B. Bhend, Rochester, MN (US);
David F. Heidel, Mahopac, NY (US);
Naoko Pia Sanda, Chappaqua, NY (US);
Scott B. Swaney, Catskill, NY (US);
Jane Jones, legal representative, Yorktown Heights, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system are provided for accelerated detection of soft error rates (SER) in integrated circuits (IC's) due to transient particle emission. An integrated circuit is packaged for accelerated transient particle emission by doping the underfill thereof with a transient-particle-emitting material having a predetermined emission rate. The emission rate is substantially constant over a predetermined period of time for testing. Accelerated transient-particle-emission testing is performed on the integrated circuit. Single-event upsets due to soft errors are detected, and a quantitative measurement of SER is determined.