The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2006

Filed:

Mar. 31, 2004
Applicants:

Yoshiki Hirano, Fuchu, JP;

Yoshiro Shiokawa, Hachioji, JP;

Harumi Maruyama, Kunitachi, JP;

Megumi Nakamura, Fuchu, JP;

Inventors:

Yoshiki Hirano, Fuchu, JP;

Yoshiro Shiokawa, Hachioji, JP;

Harumi Maruyama, Kunitachi, JP;

Megumi Nakamura, Fuchu, JP;

Assignee:

Anelva Corporation, Fuchu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/26 (2006.01); G01N 27/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ion attachment mass spectrometry apparatus causing positively charged metal ions to attach to molecules of a gas to be measured in an attachment region to generate attached ions and then performing mass spectrometry on the attached ions by a mass spectrometer, has a metal ion selective disassociation unit for selectively making the metal ions attached to the specific molecules in the attachment region disassociate. By making the metal ions attached to the specific molecules such as HO disassociate, a state is formed where the metal ions are attached to only the sample gas to be measured and the reliability of measurement of the gas is improved.


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