The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2006
Filed:
Dec. 16, 2003
Helmut Selbach, Waldbronn, DE;
Bernd Armbruster, Karlsruhe, DE;
Helmut Selbach, Waldbronn, DE;
Bernd Armbruster, Karlsruhe, DE;
Polytec GmbH, Waldbronn, DE;
Abstract
A measurement device for oscillation measurement, as well as a corresponding method, is proposed, wherein the oscillation measurement is performed by at least one laser interferometer (), whose measurement beam is directed onto various measurement points () of the object () for generating a scanning movement, and the obtained oscillation data is correlated with the position data of the respective measurement point () and evaluated or displayed. In particular, for three-dimensional measurements, the invention reduces the measurement complexity because the scanning device is a robot arm, which moves a measurement head of the laser interferometer to the desired measurement points on the object.