The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2006

Filed:

Apr. 14, 2003
Applicants:

Thomas J. Knips, Wappingers Falls, NY (US);

Tom Y. Chang, Poughkeepsie, NY (US);

James W. Dawson, Poughkeepsie, NY (US);

Douglas J. Malone, Pleasant Valley, NY (US);

Inventors:

Thomas J. Knips, Wappingers Falls, NY (US);

Tom Y. Chang, Poughkeepsie, NY (US);

James W. Dawson, Poughkeepsie, NY (US);

Douglas J. Malone, Pleasant Valley, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method and system for testing a memory array having a non-uniform binary address space. The test system includes a test engine for generating addresses for the memory array and for generating and applying data patterns to the memory array. The test engine has an address generator including a series combination of a linear register and a binary counter for generating the non-uniform address.


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