The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2006
Filed:
Mar. 25, 2004
Joseph Daniel Tobiason, Woodinville, WA (US);
Michelle Mary Milvich, Seattle, WA (US);
Michael Nahum, Kirkland, WA (US);
Vidya Venkatachalam, Bellevue, WA (US);
Joseph Daniel Tobiason, Woodinville, WA (US);
Michelle Mary Milvich, Seattle, WA (US);
Michael Nahum, Kirkland, WA (US);
Vidya Venkatachalam, Bellevue, WA (US);
Mitutoyo Corporation, Kawasaki, JP;
Abstract
A position sensor using a novel optical path array (OPA) element, an angle-selective spatial filter, and an imaging array is capable of measuring the translation and orientation relative to a target member in X, Y, Z, yaw, pitch, and roll ('6D') simultaneously, and with high precision. A target member includes an array of target points surrounded by a contrasting surface. The position sensor uses the OPA element in combination with the angle-selective spatial filter in a target point imaging arrangement such that the imaging array of the position sensor only receives light rays that enter the OPA element according to an operable cone angle α. Accordingly, each target point generally produces a ring-shaped image having a size on the imaging array that varies with the Z position of each target point. The X-Y position of each target point image on the imaging array varies with the X-Y position of each target point. Accordingly, three or more target point images analyzed in the same image are usable to determine a 6D measurement relative to the target member. X and Y displacement of the target member can be accumulated by known methods and the other 6D measurement components are absolute measurements at any position.