The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2006
Filed:
Mar. 19, 2003
Jose A. Paredes, Austin, TX (US);
Philip G. Shephard, Iii, Round Rock, TX (US);
Timothy M. Skergan, Austin, TX (US);
Neil R. Vanderschaaf, Round Rock, TX (US);
Jose A. Paredes, Austin, TX (US);
Philip G. Shephard, III, Round Rock, TX (US);
Timothy M. Skergan, Austin, TX (US);
Neil R. Vanderschaaf, Round Rock, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, computer program product and system for testing stuck-at-faults. A first register may be loaded with a first value where the first value may be written into each entry in a memory array. A second register may be loaded with a second value. A third register may be loaded with either the second value or a third value. The second and third values are pre-selected to test selector circuits for stuck-at-faults with a pattern where the pattern includes a set of bits to be inputted to selector circuits and a set of bits to be stored in the memory cells. A value stored in the n-most significant bits in both the second and third registers may be predecoded to produce a predecode value. The predecode value may be compared with the value stored in the n-most significant bits in an entry in the memory array to determine a stuck-at-fault.