The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2006
Filed:
Nov. 13, 2002
Marc Billemaz, Fresnes, FR;
Pascal Bornat, Clamart, FR;
Jean-yves Brunel, Paris, FR;
Cadence Design Systems, Inc., San Jose, CA (US);
Abstract
In system design simulators, probes are software objects that collect data from simulated system components. A probe synchronization method and device are used to collect simulation data from the components during a period of interest. For example, a given event that occurs during the simulation may signal the beginning of the period, and another event may signal the end of the period. An acquisition window having a starting point and an ending point coinciding with the occurrence of the events may be used by a probe master to cause one or more probes to collect data during this period of interest. A unique Identifier or Tag of this period of interest is generated by the Probe Master and sent to all the slave probes. This Tag is dumped in the simulation database. It allows post-processing correlations between high-level simulation events and low-level model reactions.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile