The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2006
Filed:
Aug. 06, 2002
William E. Corr, Twickenham, GB;
William E. Corr, Twickenham, GB;
Micron Technology, Inc., Boise, ID (US);
Abstract
Systems and methods are provided for reducing a set of data points into a subset of best fit data points. According to one aspect, a method of adjusting a series of N data points into best fit data points for a set of sample data points that form a data source is provided. According to this method, M segments are identified, wherein M equals N−1. Each segment has endpoints defined by adjacent subset data points. An iterative process is performed that includes determining a linear interpolation error for each of the M segments, selecting a target segment (S) from the segments, and reducing the interpolation error for Sby moving one endpoint of Sby an increment corresponding to at least one sample data point in the series of sample data points to shorten S. Other methods and systems are provided herein.