The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2006

Filed:

Feb. 18, 2004
Applicants:

Marie-claire Cyrille, San Jose, CA (US);

Meng Ding, Mountain View, CA (US);

Kuok San Ho, Santa Clara, CA (US);

Prakash Kasiraj, San Jose, CA (US);

Ernesto Marinero, Saratoga, CA (US);

James Lamar Nix, Gilroy, CA (US);

Inventors:

Marie-Claire Cyrille, San Jose, CA (US);

Meng Ding, Mountain View, CA (US);

Kuok San Ho, Santa Clara, CA (US);

Prakash Kasiraj, San Jose, CA (US);

Ernesto Marinero, Saratoga, CA (US);

James Lamar Nix, Gilroy, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/39 (2006.01);
U.S. Cl.
CPC ...
Abstract

A magnetic sensor is provided, having two bias layers separated by a decoupling layer to eliminate exchange coupling between the bias layers. The two bias layers may have differing coercivities, such that the biases provided by the bias layers to the free layer are independently adjustable. The grain structures of the two bias layers may be substantially decorrelated by the decoupling layer.


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