The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2006
Filed:
Mar. 05, 2004
Yasukazu Ono, Kasugai, JP;
Koji Okada, Kasugai, JP;
Hiroyuki Matsunami, Kasugai, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
An object of this invention is to provide a band distribution inspecting device and band distribution inspecting method capable of carrying out inspection on whether or not a scattered oscillation signal oscillated containing a frequency variation from the fundamental frequency with the fundamental frequency as a reference point has a band distribution rapidly, with a simple way and at a cheap price. A scattered oscillation signal SSS inputted to a band distribution detecting sectionis outputted as a predetermined band pass signal SBP through a band pass filterhaving a predetermined pass band of a predetermined narrow-band width Δf within a band distribution. This signal is converted to a root-mean-square value by a smoother, smoothed by a capacitor Cand transferred to a general purpose inspecting deviceas a DC signal SAV. The DC signal SAV is compared with a predetermined voltage value VX by a comparatorand its comparison result is judged by a judging sectionand then, an inspection result is outputted as a judging signal J. As a result, an edge frequency in the band distribution of the scattered oscillation signal SSS and disturbance of frequency variation within/out of the band and dullness in waveform and the like can be inspected for.