The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2006

Filed:

Sep. 03, 2003
Applicant:

Junji Sakurada, Sapporo, JP;

Inventor:

Junji Sakurada, Sapporo, JP;

Assignee:

Mitutoyo Corporation, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 3/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measurement support apparatus comprises a shape definition data input section, a contour shape generator, a measurement part program input section, an analyzer, a synthesizer, and a display unit. The shape definition data input section is used for entering shape definition data for an object to be measured. The contour shape generates a contour shape based on the shape definition data. The measurement part program input section is used for entering a measurement part program. The analyzer analyzes the measurement part program and outputs the analysis results. The synthesizer synthesizes the analysis results with the contour shape. The display unit displays the synthesis image.


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