The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2006

Filed:

Jul. 05, 2002
Applicants:

Takayuki Morikawa, Yokohama, JP;

Katsuhisa Iiyoshi, Kawasaki, JP;

Yuji Kanno, Tokyo, JP;

Hideo Zuinen, Atsugi, JP;

Inventors:

Takayuki Morikawa, Yokohama, JP;

Katsuhisa Iiyoshi, Kawasaki, JP;

Yuji Kanno, Tokyo, JP;

Hideo Zuinen, Atsugi, JP;

Assignee:

Anritsu Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04Q 7/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measuring section measures a digital multiplex signal divided into slot units, as a signal to be measured. A display control section displays, on a screen, a measured waveform of the signal. An analyzing section analyzes, in the slot units, information relating to the measured waveform of the signal. A storage section stores the information relating to the measured waveform of the signal which is analyzed in the slot units, as analyzed information of the slot unit. A marker display control section displays a slot marker to designate an arbitrary slot, in correspondence with the measured waveform of the signal which is displayed on the screen. A slot information display control section reads, from the storage section, the analyzed information of the slot unit corresponding to the slot designated by the slot marker displayed on the screen, and displays the analyzed information of the slot unit in correspondence with the slot marker.


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