The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7068350 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 27, 2006

Filed:

Jun. 09, 2003
Applicants:

Kenji Nishi, Yokohama, JP;

Masahiko Okumura, Tokyo-To, JP;

Hiroki Okuno, Fukaya, JP;

Inventors:

Kenji Nishi, Yokohama, JP;

Masahiko Okumura, Tokyo-To, JP;

Hiroki Okuno, Fukaya, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/42 (2006.01); G03B 27/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

After exposure of a divided area on a wafer is completed, for exposure of the next divided area, a control unit sends configuration information on control parameters necessary to expose the next divided area to a stage control system, sometime before the stage control system begins deceleration of a reticle stage and a wafer stage in a scanning direction. Therefore, both stages do not have to be suspended before acceleration for the stage control system to receive the configuration information on control parameters necessary to expose the next divided area, and since suspension time is not required, throughput can be improved. In this case, no serious problems occur, so the performance of other devices is not disturbed.


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