The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2006

Filed:

Sep. 13, 2002
Applicants:

Yoshinori Hayashi, Kanagawa, JP;

Tomohiro Nakajima, Tokyo, JP;

Mitsumi Fujii, Iwate, JP;

Yukito Satoh, Miyagi, JP;

Eiji Mochizuki, Kanagawa, JP;

Inventors:

Yoshinori Hayashi, Kanagawa, JP;

Tomohiro Nakajima, Tokyo, JP;

Mitsumi Fujii, Iwate, JP;

Yukito Satoh, Miyagi, JP;

Eiji Mochizuki, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In this optical scanning device, a plurality of scanning optical systems are arranged in a main scanning direction. Each of the scanning optical systems includes a deflecting unit performing an optical scanning by oscillation. Scanning frequencies of the deflecting units are substantially equal to one another. Each of the deflecting units is provided with means for varying the scanning frequency. The scanning frequency of each of the deflecting units is set midway between a maximum value and a minimum value of a resonance frequency intrinsic to the deflecting unit.


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