The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2006
Filed:
Oct. 30, 2004
Applicants:
Chul-sung Park, Seoul, KR;
Yong-hwan Noh, Suwon-shi, KR;
Byong-kwon Lee, Suwon-shi, KR;
Hyang-ja Yang, Suwon-shi, KR;
Inventors:
Chul-Sung Park, Seoul, KR;
Yong-Hwan Noh, Suwon-shi, KR;
Byong-Kwon Lee, Suwon-shi, KR;
Hyang-Ja Yang, Suwon-shi, KR;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
Disclosed is a semiconductor integrated circuit device which includes a test element group circuit connected between a first and a second pad. The test element group circuit includes a plurality of semiconductor devices connected in series between the first and second pads. At least two adjacent ones of the semiconductor devices are connected to each other via a signal path that is formed by a multi-layer interconnection structure.