The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7065421 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 20, 2006

Filed:

Jun. 09, 2004
Applicants:

Wen-jen Chiu, Hsinchu, TW;

Wei-chin Hsiao, Hsinchu, TW;

Cheng-che Chen, Taipei, TW;

Inventors:

Wen-Jen Chiu, Hsinchu, TW;

Wei-Chin Hsiao, Hsinchu, TW;

Cheng-Che Chen, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A manufacturing management system and method. The system includes a monitor module and a planning module. The monitor module receives real-time yield information of one product currently being processed in a production line. The planning module dynamically manages a manufacturing schedule of the product by holding lots corresponding to the product to avoid being processed if the yield information is greater than a target yield, and releasing additional lots corresponding to the product to be processed by the production line if the yield information is less than the target yield.


Find Patent Forward Citations

Chiu, Wen-Jen. (2006). Manufacturing management system and method (U.S. Patent No. 7065421). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7065421

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