The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7065174 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 20, 2006

Filed:

Nov. 12, 2004
Applicants:

Heikki Johannes Sipilä, Espoo, FI;

Riitta Kaijansaari, Helsinki, FI;

Inventors:

Heikki Johannes Sipilä, Espoo, FI;

Riitta Kaijansaari, Helsinki, FI;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
Abstract

A portable measurement apparatus is presented for inducing and measuring fluorescent X-ray radiation. It comprises an X-ray source () adapted to controllably irradiate a sample () with X-rays, and a detector () adapted to detect fluorescent radiation emitted by said sample (). The X-ray source () is an X-ray tube, an anode of which comprises at least one of silver, rhodium and molybdenium. Consequently said X-ray tube is adapted to controllably emit L-line radiation of at least one of silver, rhodium and molybdenium.


Find Patent Forward Citations

Sipilä, Heikki. (2006). Measurement arrangement for x-ray fluoresence analysis (U.S. Patent No. 7065174). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7065174

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