The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2006
Filed:
Mar. 31, 2003
Yuichiro Hashimoto, Kokubunji, JP;
Izumi Waki, Asaka, JP;
Kiyomi Yoshinari, Tokyo, JP;
Yasushi Terui, Tsuchiura, JP;
Tsukasa Shishika, Hitachinaka, JP;
Marvin L. Vestal, Farmingham, MA (US);
Yuichiro Hashimoto, Kokubunji, JP;
Izumi Waki, Asaka, JP;
Kiyomi Yoshinari, Tokyo, JP;
Yasushi Terui, Tsuchiura, JP;
Tsukasa Shishika, Hitachinaka, JP;
Marvin L. Vestal, Farmingham, MA (US);
Hitachi High-Technologies Corporation, Tokyo, JP;
Applera Corporation, Norwalk, CT (US);
Abstract
A mass spectrometer according to the present invention has an ionization source for generating ions; an ion trap for accumulating the ions; a time-of-flight mass spectrometer for performing mass spectrometry analysis on the ions by use of a flight time; a collision damping chamber disposed between the ion trap and the time-of-flight mass spectrometer and having a plurality of electrodes therein, which produce a multi-pole electric field, wherein a gas is introduced into the collision damping chamber to reduce kinetic energy of the ions ejected from the ion trap; and an ion transmission adjusting mechanism disposed between the ion trap and the collision damping chamber to allow or prevent injection of the ions from the ion trap to the collision damping chamber. The mass spectrometer provides greatly enhanced qualitative and quantitative analysis capabilities, as compared with conventional techniques.